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Steep Front Impulse Wave Device

LQHSD Serial Steep Wave Device for High Voltage Impulse Testing

600kV-rated steep wave impulse testing device for detecting faults in composite insulators, featuring adjustable sphere gap and mobile chassis design.


  • US$ 4,919.00
  • Lead time: 30 days

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Product Details

Product Tags

LQHSD Serial Steep Wave Device for High Voltage Impulse Testing

Precision Steep Front Impulse Voltage Measurement

The LQHSD Serial Steep Wave Device is a specialized instrument designed for steep front impulse voltage measurement in high-voltage testing applications. With a rated voltage of 600kV, this system is particularly effective for detecting internal faults in composite insulators and other high-voltage components.

Technical Specifications

Basic Parameters

  • Rated voltage: 600kV

  • Wave front steepness: 1000-4000 kV/μs

  • Primary capacitor: 300pF

Sphere Gap Assembly

  • Electrode type: Oval balls

  • Diameter: 250mm

  • Adjustment: Electric control from desk

System Configuration

  • 300pF capacitor

  • Sphere gap assembly

  • Electric transmission device

  • Ball rack

  • Mounted on mobile chassis

Testing Methodology

The LQHSD device has proven particularly effective for detecting various types of faults in composite insulators:

Conductive Channel Faults

Identifies conductive pathways that compromise insulation integrity

Semi-Conductive Airy Channels

Detects partial conductive paths within insulator material

Partial Air Bubbles

Locates small gas pockets that affect dielectric strength

Analysis Procedure

  1. Apply steep-front wave impulse voltage (1000-4000 kV/μs)

  2. Measure response from test specimen

  3. Calculate internal electric field distribution using finite element analysis

  4. Compare with experimental results

  5. Verify breakdown occurrence

Applications

  • Composite insulator fault detection

  • High-voltage component quality assurance

  • Insulation material research

  • Power equipment diagnostic testing

  • Laboratory impulse testing

Key Benefits

  • Effective fault detection: Proven capability to identify severe internal faults

  • Precise control: Electrically adjustable sphere gap

  • Portable design: Compact, mobile chassis

  • Comprehensive analysis: Combines experimental and computational methods

  • High reliability: Consistent correlation between test and simulation results

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